High/low temperature setups for submillimetric samples under various extreme conditions at the AILES beamline

Taverna, C.; Rader, K.; Brubach, J.B.; Voute, A.; Dronova, M.; Couillard-Labonnote, L.; Libois, Q.; Roy, P.; Verseils, M.

doi:10.1107/S1600577526004832

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

IUCr IT WDC

home archive editors for authors for readers submit open access

view article

Figure 14
Temperature difference between the outer body of the DAC (T_cell) and its diamond anvils (T_diam) against read T_cell. The circled measurement was obtained after a thermalization time longer than 20 min.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 4| July 2026|

https://doi.org/10.1107/S1600577526004832

Open

access

Follow J. Synchrotron Rad.

Search IUCr Journals		doi		Advanced search
Author		volume	page