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Figure 1
(a) Rendering of the load frame and diffraction geometry. The incident X-ray beam is parallel to xlab. The diffraction condition of the sample is changed by rotation of the entire load frame (sample) around axes ylab and zlab by angles μ (left-handed rotation convention) and ω, respectively. (b) Photograph of the sample environment taken along the beam direction. (c) Magnified view of the dovetail-shaped sample mounts.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 33| Part 4| July 2026|
https://doi.org/10.1107/S1600577526005266
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