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Figure 6
Maps of the absolute value of the RSS for the 12 slip systems of the silicon wafer sample. The distributions are shown over the full sample area in sample coordinate system (x, z in mm, see Fig. 3[link]). The positions of the Berkovich indentations are indicated by black dots.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 33| Part 4| July 2026|
https://doi.org/10.1107/S1600577526004728
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