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Figure 5
(a) XRF maps recorded from the Ti micropillar at different deformation stages: pristine, step1, step2 and post-deformation. (b) Displacement–time graph applied during uniaxial compression test. Raster scans were performed in step-scan mode over 30 µm × 35 µm with 30 × 35 points (1 µm step size, 1 s exposure per point; total scan time 1592 s including overhead; 10 s stabilization before and after each load step).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 33| Part 4| July 2026|
https://doi.org/10.1107/S1600577526003723
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