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Figure 6
(a) q-value distribution (in nm−1) maps evaluated from azimuthal integration of the two-dimensional XRD data collected from the α-Ti micropillar at different deformation stages: pristine, step1, step2, and post-deformation; the displayed q-range (20–35 nm−1) represents the azimuthal spread of diffraction intensity in reciprocal space and reflects local variations in lattice spacing and microstrain. (b) Orientation spread (in degrees) maps obtained from radial integration of the same XRD datasets; the orientation map shows the angular intensity distribution within the range 0–180°, covering the full orientation spread of the diffraction signal.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 33| Part 4| July 2026|
https://doi.org/10.1107/S1600577526003723
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