GIWAXS using microbeam applied in halide perovskite films for high spectral resolution and mapping capability

Fu, M.; He, B.; Zhang, L.; Su, Z.; Miao, Y.; Sun, Q.; Zhang, J.; Wang, S.; Wang, Z.; Wang, X.; Wang, Y.; Sun, B.; Wen, W.; Zhao, Y.; Wang, C.; Gao, X.

doi:10.1107/S1600577526004303

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Figure 1
(a) Schematic of X-ray microfocusing and the µ-GIWAXS experimental setup. (b) Schematic illustrating the broadening of a diffraction peak in GIWAXS due to the footprint effects. 2D GIWAXS patterns of a CsFAMAPbI₃ perovskite film measured with an incidence angle of 1° at the beamline BL14B1 in (c) and BL03HB in (d), respectively. The corresponding 1D GIWAXS diffraction spectra derived from (c) and (d) are shown in (e) and (f), respectively.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 4| July 2026|

https://doi.org/10.1107/S1600577526004303

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