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Figure 4
(a) A CsFAMAPbI3 film sample, inscribed with the letters `SSRF', as a sample for micro-structural analysis. (b) Schematic of the setup for the µ-mapping experiment. (c) The obtained µ-GIWAXS mapping image of the CsFAMAPbI3 (001) diffraction peak intensity from the CsFAMAPbI3 film.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
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