GIWAXS using microbeam applied in halide perovskite films for high spectral resolution and mapping capability

Fu, M.; He, B.; Zhang, L.; Su, Z.; Miao, Y.; Sun, Q.; Zhang, J.; Wang, S.; Wang, Z.; Wang, X.; Wang, Y.; Sun, B.; Wen, W.; Zhao, Y.; Wang, C.; Gao, X.

doi:10.1107/S1600577526004303

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Figure 5
(a, b, c) Maps over a 4 mm × 5 mm area of a CsFAMAPbI₃ film showing (a) (001) diffraction peak intensity, indicating the crystallinity of the α-phase perovskite; (b) (001) orientational order parameter, representing the degree of deviation from the out-of-plane orientation; and (c) PbI₂ peak intensity. The statistical distributions derived from (a, b, c) is shown in (d). (e) Lattice strain maps over scanning areas of 4 mm × 5 mm of the CsFAMAPbI₃ film.

JOURNAL OF
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ISSN: 1600-5775

Volume 33| Part 4| July 2026|

https://doi.org/10.1107/S1600577526004303

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