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Figure 4
Instrumental resolution of the levitation diffraction setup: integrated diffraction patterns (a) and corresponding FWHMs (b) of LaB6 standard collected at different SDDs. Measured FWHM values (symbols) are compared with theoretical resolution (solid lines), as detailed in the supporting information. Dependence of the instrumental resolution on SDD (c), demonstrated with the FWHM of the main (110) diffraction peak of the LaB6 standard. Inserts illustrate the reduction of measured intensity due to air scattering as photons travel longer distances with increasing SDD.

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SYNCHROTRON
RADIATION
ISSN: 1600-5775
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