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Figure 5
Simplified schematic of the geometrical origins of peak broadening at a given diffraction angle 2θ and sample-to-detector distance, arising from the finite sizes of the beam (b), sample (s), and detector pixels (p) (left). Schematic illustration of the gauge volume in diffraction experiments on a spherical sample under stationary and rotating conditions. Rotation of the sample leads to averaging over a larger effective volume, enhancing statistical sampling and reducing orientation-related artifacts (right).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 33| Part 4| July 2026|
https://doi.org/10.1107/S1600577526003541
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