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Figure 1
(a) Experimental configuration for speckle-based X-ray wavefront sensing using a coded mask or a random diffuser (e.g. sandpaper). (b) Data-analysis workflow in WFSuite: relative metrology module using multi-scan speckle stacks analyzed by WSVT, or two images analyzed by WXST; and absolute phase module using coded-mask single-shot measurements analyzed by WXST or SPINNet.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 33| Part 4| July 2026|
https://doi.org/10.1107/S160057752600500X
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