Extending high-resolution ptychography into the tender X-ray regime at NanoTerasu BL10U

Sasaki, Y.; Ishiguro, N.; Abe, M.; Takazawa, S.; Okawa, N.; Takahashi, Y.

doi:10.1107/S1600577526011549

Figure 2
(a) Diffraction pattern of a 100 nm-thick Ta test chart at 4.5 keV. (b) Amplitude image of the reconstructed probe function. (c) Reconstructed phase image of the test chart (left) and magnified view of finest structures (right). (d) Line profile across an edge in the reconstructed phase image and corresponding error-function fit.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 34| Part 1| January 2027|

https://doi.org/10.1107/S1600577526011549

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