Ab initio structure determination using dispersive differences from multiple-wavelength synchrotron-radiation powder diffraction data

Helliwell, J.R.; Helliwell, M.; Jones, R.H.

doi:10.1107/S010876730503237X

Acta Crystallographica Section A
Acta Crystallographica
Section A FOUNDATIONS AND ADVANCES

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 2
Comparison of dispersive difference Patterson sections w = 0, w = ¼ and w = ½ for (i) $[f '_{\rm dip}]$ − 1.8 Å, (ii) $[f '_{\rm dip}]$ − 1.3 Å, (iii) $[f '_{\rm dip}-f '_{\rm base}]$ , (iv) $[f '_{\rm dip}]$ − 2.16 Å, (v) calculated $[f '_{\rm dip}]$ − 1.8 Å. The contour baseline was based on inspection of the maximum ρ values away from the origin peak and from Harker sections and thus was an estimation of the noise level for each wavelength pair. The contour interval was 10% of the maximum peak heights in the Harker sections for each wavelength pair.

FOUNDATIONS
ADVANCES

ISSN: 2053-2733

Volume 61| Part 6| October 2005| Pages 568-574

doi:10.1107/S010876730503237X

Follow Acta Cryst. A

Search term		doi		Advanced search
Author		volume	page