G. Kostorz, ETH Zurich, Wolfgang-Pauli-Str. 16, CH-8093 Zurich, Switzerland (fax: +41-446331105; e-mail: gk-iucr@ethz.ch)
W. Steurer, Laboratory of Crystallography, Wolfgang-Pauli-Strasse 10, ETH Zurich, CH-8093 Zurich, Switzerland (e-mail: steurer@mat.ethz.ch)
Areas of expertise: Quasicrystals; higher-dimensional crystallography; complex structures.
S. Billinge, Department of Applied Physics and Applied Mathematics, Columbia University, 200 Mudd, 500 W 120th Street, New York, NY 10027, USA (e-mail: sb2896@columbia.edu)
Areas of expertise: Local structure; nanostructure; pair distribution functions; nanocrystallography.
C. W. Carter, Department of Biochemistry, School of Medicine, University of North Carolina, Chapel Hill, NC 27599-7260, USA (e-mail: carter@med.unc.edu)
Areas of expertise: Biological crystallography; phase determination; statistics; protein conformation.
V. E. Dmitrienko, Institute of Crystallography, Leninsky pr. 59, Moscow 117333, Russia (e-mail: dmitrien@ns.crys.ras.ru)
Areas of expertise: Quasicrystals; X-ray polarization phenomena; resonant X-ray scattering; diffraction physics and extinction; forbidden reflections.
J.-G. Eon, Instituto de Química, Universidade Federal do Rio de Janeiro, Avenida Athos da Silveira Ramos, 149 Bloco A, Cidade Universitária, Rio de Janeiro 21941-909, Brazil (e-mail: jgeon@iq.ufrj.br)
Areas of expertise: Catalysis; structural chemistry; graph theory in crystallography.
P. F. Fewster, PANalytical Research Centre, Sussex Innovation Centre, Science Park Square, Falmer, Brighton, East Sussex BN1 9SB, England (e-mail: paul.fewster@panalytical.com)
Areas of expertise: Semiconductors; X-ray diffraction; X-ray optics; thin films.
W. F. Kuhs, Georg-August University Göttingen, GZG Crystallography, Goldschmidtstr. 1, D-37077 Göttingen, Germany (e-mail: wkuhs1@gwdg.de)
Areas of expertise: Elastic and inelastic scattering (neutrons and X-rays); crystal physics; crystal chemistry; crystal growth; high pressure.
J. Miao, Department of Physics and Astronomy, University of California, Box 951547, Los Angeles, CA 90095-1547, USA (e-mail: miao@physics.ucla.edu)
Areas of expertise: Coherent diffraction imaging; phase retrieval; structure determination; X-ray free-electron laser applications.
V. Petrícek, Department of Structure Analysis, Institute of Physics, Academy of Sciences of the Czech Republic, v.v.i., Cukrovarnicka 10, 162 00 Prague 6, Czech Republic (e-mail: petricek@fzu.cz)
Areas of expertise: Aperiodic crystals; solution and refinement of crystal structures; twinning; anharmonic anisotropic displacement parameters.
H. Schenk, Laboratorium voor Kristallografie, HIMS, FWNI, University of Amsterdam, Valckenierstraat 65, 1018XE Amsterdam, The Netherlands (e-mail: h.schenk@uva.nl)
Areas of expertise: Direct methods; powder diffraction; time-resolved studies; properties and polymorphism of fats.
K. Tsuda, Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan (e-mail: k_tsuda@tagen.tohoku.ac.jp)
Areas of expertise: Convergent-beam electron diffraction; dynamical diffraction; electron crystallography.
S. W. Wilkins, CSIRO, Materials Science and Engineering, Private Bag 33, Clayton South MDC, VIC 3169, Australia (e-mail: steve.wilkins@csiro.au)
Areas of expertise: Diffraction theory; phase-contrast imaging; X-ray optics; synchrotron instrumentation; high-precision diffractometry; maximum-entropy methods.
P. R. Willmott, Swiss Light Source, Paul Scherrer Institute, CH-5232 Villigen, Switzerland (e-mail: philip.willmott@psi.ch)
Areas of expertise: Surface X-ray diffraction; synchrotron radiation; thin films; pulsed laser deposition; complex metal oxides.
P. Paufler, Institut für Strukturphysik, Fachrichtung Physik, Fakultät Mathematik und Naturwissenschaften, Technische Universität Dresden, D-01062 Dresden, Germany (e-mail: paufler@physik.tu-dresden.de)