G. Kostorz, ETH Zurich, Wolfgang-Pauli-Str. 16, CH-8093 Zurich, Switzerland (fax: +41-446331105; e-mail: gk-iucr@ethz.ch)
D. Schwarzenbach, Laboratory of Crystallography, Ecole Polytechnique Fédérale, EPFL-FSB-IPMC-LCr, Le Cubotron, CH-1015 Lausanne, Switzerland (e-mail: dieter.schwarzenbach@epfl.ch)
Areas of expertise: Inorganic structures; electron densities; refinement.
Y. Amemiya, Department of Advanced Material Science, School of Frontier Sciences, The University of Tokyo, 7-3-1 Hongo, Bunkyo, Tokyo 113-8656, Japan (e-mail: amemiya@k.u-tokyo.ac.jp)
Areas of expertise: X-ray physics; X-ray instrumentation; diffraction physics.
A. Authier, Université Pierre et Marie Curie, Villechenine, F-87470 Peyrat-le-Chateau, France (e-mail: aauthier@wanadoo.fr)
Areas of expertise: Diffraction physics; X-ray topography; crystal defects; crystal growth.
C. W. Carter, Department of Biochemistry, School of Medicine, University of North Carolina, Chapel Hill, NC 27599-7260, USA (e-mail: carter@med.unc.edu)
Areas of expertise: Biological crystallography; phase determination; statistics; protein conformation.
P. Coppens, Department of Chemistry, 732 Natural Sciences and Mathematics Complex, State University of New York at Buffalo, Buffalo, NY 14260-3000, USA (e-mail: coppens@acsu.buffalo.edu)
Areas of expertise: Anomalous dispersion; electron densities; incommensurate modulated structures; photocrystallography; time-resolved diffraction.
V. E. Dmitrienko, Institute of Crystallography, Leninsky pr. 59, Moscow 117333, Russia (e-mail: dmitrien@ns.crys.ras.ru)
Areas of expertise: Quasicrystals; X-ray polarization phenomena; resonant X-ray scattering; diffraction physics and extinction; forbidden reflections.
D. L. Dorset, Advanced Material Characterization, ExxonMobil Research and Engineering Company, 1545 Route 22 East, Room LA-170, Annandale, NJ 08801, USA (e-mail: d.l.dorset@exxonmobil.com)
Areas of expertise: Electron crystallography; linear chain assemblies; crystallographic phase determination.
J.-G. Eon, Instituto de Química, Universidade Federal do Rio de Janeiro, Cidade Universitária - Ilha do Fundão, Rio de Janeiro, 21945-970 Brazil (e-mail: jgeon@iq.ufrj.br
Areas of expertise: catalysis; structural chemistry; graph theory in crystallography.
P. F. Fewster, PANalytical Research Centre, Sussex Innovation Centre, Science Park Square, Falmer, Brighton, East Sussex BN1 9SB, England (e-mail: paul.fewster@panalytical.com)
Areas of expertise: Semiconductors; X-ray diffraction; X-ray optics; thin films.
R. P. Millane, Department of Electrical and Computer Engineering, University of Canterbury, Private Bag 4800, Christchurch, New Zealand (e-mail: rick@elec.canterbury.ac.nz)
Areas of expertise: Fibre diffraction; disorder; phase retrieval.
D. Pandey, School of Materials Science and Technology, Banaras Hindu University, Varanasi 221005, India (e-mail: dpandey@bhu.ac.in)
Areas of expertise: Diffuse scattering; aperiodic crystals; phase transitions (ferroelectrics).
J. M. Perez-Mato, Dept Física de la Materia Condensada, Universidad del País Vasco, Apdo 644, 48080 Bilbao, Spain (e-mail: wmppemam@lg.ehu.es)
Areas of expertise: Aperiodic crystals; phase transitions; group theory; crystal physics.
K. Tanaka, Department of Materials Science and Engineering, Nagoya Institute of Technology, Gokisho-cho, Showa-ku, Nagoya 466-8555, Japan (e-mail: tanaka.kiyoaki@nitech.ac.jp)
Areas of expertise: Crystal chemistry; electron density; thermal vibrations; X-ray wavefunction analysis.
H. Zimmermann, Institüt für Physik der kondensierten Materie, Lehrstuhl für Kristallographie und Strukturphysik, Universität Erlangen-Nürnberg, Staudtstrasse 3, D-91058 Erlangen, Germany (e-mail: zimmermann@krist.uni-erlangen.de)
Areas of expertise: Mathematical crystallography; crystal structures; X-ray crystallography; structure determination.
P. Paufler, Institut für Strukturphysik, Fachrichtung Physik, Fakultät Mathematik und Naturwissenschaften, Technische Universität Dresden, D-01062 Dresden, Germany (e-mail: paufler@physik.tu-dresden.de)