Statistical analysis of multipole-model-derived structural parameters and charge-density properties from high-resolution X-ray diffraction experiments

Kamiński, R.; Domagała, S.; Jarzembska, K.N.; Hoser, A.A.; Sanjuan-Szklarz, W.F.; Gutmann, M.J.; Makal, A.; Malińska, M.; Bąk, J.M.; Wozńiak, K.

doi:10.1107/S2053273313028313

Acta Crystallographica Section A
Acta Crystallographica
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Figure 1
Example plots of (a) I_{set 2} versus I_{set 12} (R² = 0.997) and (b) $[\sigma ({I}_{{\rm set} 2})]$ versus $[\sigma ({I}_{{\rm set} 12})]$ (R² = 0.831) relationships for the raw (scaled) data sets. The black solid line is the reference line.

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ISSN: 2053-2733

Volume 70| Part 1| December 2014| Pages 72-91

doi:10.1107/S2053273313028313

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