Statistical analysis of multipole-model-derived structural parameters and charge-density properties from high-resolution X-ray diffraction experiments

Kamiński, R.; Domagała, S.; Jarzembska, K.N.; Hoser, A.A.; Sanjuan-Szklarz, W.F.; Gutmann, M.J.; Makal, A.; Malińska, M.; Bąk, J.M.; Wozńiak, K.

doi:10.1107/S2053273313028313

Acta Crystallographica Section A
Acta Crystallographica
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Figure 2
Histograms showing the acceptance ratios (α = 10%) for the Shapiro–Wilk test on the reflection raw intensity values versus (a) resolution and (b) raw (scaled and averaged) intensity.

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ISSN: 2053-2733

Volume 70| Part 1| December 2014| Pages 72-91

doi:10.1107/S2053273313028313

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