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Figure 1
Observed (dots), calculated (superimposed solid line) and difference profiles after Rietveld refinement. The reflection positions are marked by ticks.

Journal logoSTRUCTURAL
CHEMISTRY
ISSN: 2053-2296
Volume 60| Part 9| August 2004| Pages m449-m450
doi:10.1107/S0108270104016129
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