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![[Figure 2]](fa3277fig2mag.jpg)
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Figure 2
High-resolution synchrotron powder diffraction data for (I) ![[link]](../../../../../../logos/arrows/c_arr.gif) (dots) and the Rietveld fit to the data (solid line). The lower trace is the difference, i.e. measured minus calculated, plotted on the same vertical scale. |
![[Figure 2]](fa3277fig2.jpg)
 | STRUCTURAL CHEMISTRY |
ISSN: 2053-2296
