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The title compound, C22H22O2, crystallizes in the space group P21/c, with one half mol­ecule in the asymmetric unit and Z = 2.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S1600536803009966/bt6276sup1.cif
Contains datablocks I, global

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S1600536803009966/bt6276Isup2.hkl
Contains datablock I

CCDC reference: 214834

Key indicators

  • Single-crystal X-ray study
  • T = 293 K
  • Mean [sigma](C-C) = 0.002 Å
  • R factor = 0.045
  • wR factor = 0.131
  • Data-to-parameter ratio = 20.0

checkCIF results

No syntax errors found

ADDSYM reports no extra symmetry








Comment top

The title compound, (I), is a new compound, synthesized as a precursor of substituted phenylene–vinylene oligomers, which are novel compounds for use as semiconductors in an electronic nose (Vanneste et al., 1998; De Wit et al., 1998). The structure of (I) is, apart from the outer phenyl rings, planar, with a maximum deviation in the torsion angles of −176.74 (13)° for C1—O1—C4—C5. The angle between the least-squares planes through the phenyl rings is 79.38 (9)°. The particular arrangement of the rings allows an intermolecular interaction between the π-system of the outer rings and one of the H atoms of the central ring [Cg1···H21 2.71 Å; Cg1 is the centroid of ring C6–C11; symmetry code: (i) 1 − x, 1/2 − y, 1/2 + z]. Other than that, the structure contains no surprises.

Experimental top

The synthesis of (I) was carried out under a nitrogen atmosphere. Sodium (13.8 g, 0.60 mol) in ethanol (100 ml) was added dropwise to a stirred solution of hydroquinone (33.0 g, 0.30 mol) in ethanol (100 ml). 2-Bromoethylbenzene (84.6 ml, 0.62 mol) was added dropwise to the reaction mixture, which was stirred overnight at room temperature. The temperature was subsequently raised to 318 K for a duration of 7 h, and finally to 353 K overnight. The solvent was evaporated on a rotary evaporator and the resulting oil dissolved in 50 ml of diethyl ether. The ether fraction was washed three times with 50 ml of a 10% NaOH solution and three times with 30 ml of water. After the solution was dried on MgSO4, the solvent was distilled off. After cooling, the resulting oil solidified. Recrystallization from ethanol yielded 11.6 g of 1,4-bis(2-phenylethoxy)benzene, which crystallized as white needles. The final yield was 13%. M.p. 335 K; 1H NMR (400 MHz, CDCl3, TMS): δ 7.32–7.18 (10H, m, H7, H11, H9, H8, H10), 6.80 (4H, s, H2, H3), 4.10 (2H, t, J = 7.17 Hz, H41, H42), 3.05 (2H, t, J = 7.10 Hz, H51, H52); 13C NMR (100 MHz, CDCl3, TMS): δ 153.10 (C1), 138.38 (C6), 128.94 (C7, C11), 128.43 (C8, C10), 126.39 (C9), 115.63 (C2), 69.42 (C4), 35.93 (C5).

Computing details top

Data collection: CAD-4 EXPRESS (Enraf Nonius, 1994); cell refinement: CAD-4 EXPRESS; data reduction: XCAD4 (Harms, 1996); program(s) used to solve structure: SHELXS97 (Sheldrick, 1997); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997); molecular graphics: ORTEP-3 (Farrugia, 1997); software used to prepare material for publication: WinGX (Farrugia, 1999).

Figures top
[Figure 1] Fig. 1. The molecular structure of (I), showing 50% probability displacement ellipsoids and the atom-numbering scheme.
(I) top
Crystal data top
C22H22O2Dx = 1.202 Mg m3
Mr = 318.40Melting point: 62° K
Monoclinic, P21/cMo Kα radiation, λ = 0.71073 Å
a = 8.9286 (17) ÅCell parameters from 25 reflections
b = 11.3470 (11) Åθ = 5–16°
c = 8.925 (2) ŵ = 0.08 mm1
β = 103.311 (16)°T = 293 K
V = 879.9 (3) Å3Needle, colourless
Z = 20.3 × 0.3 × 0.2 mm
F(000) = 340
Data collection top
Enraf-Nonius CAD-4
diffractometer
Rint = 0.083
Radiation source: fine-focus sealed tubeθmax = 32.0°, θmin = 2.3°
Graphite monochromatorh = 1312
non–profiled ω/2θ scansk = 1616
6278 measured reflectionsl = 013
3053 independent reflections3 standard reflections every 3600 min
1318 reflections with I > 2σ(I) intensity decay: 1%
Refinement top
Refinement on F2Primary atom site location: structure-invariant direct methods
Least-squares matrix: fullSecondary atom site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.045Hydrogen site location: inferred from neighbouring sites
wR(F2) = 0.131All H-atom parameters refined
S = 0.99 w = 1/[σ2(Fo2) + (0.0591P)2]
where P = (Fo2 + 2Fc2)/3
3053 reflections(Δ/σ)max = 0.003
153 parametersΔρmax = 0.14 e Å3
0 restraintsΔρmin = 0.20 e Å3
Crystal data top
C22H22O2V = 879.9 (3) Å3
Mr = 318.40Z = 2
Monoclinic, P21/cMo Kα radiation
a = 8.9286 (17) ŵ = 0.08 mm1
b = 11.3470 (11) ÅT = 293 K
c = 8.925 (2) Å0.3 × 0.3 × 0.2 mm
β = 103.311 (16)°
Data collection top
Enraf-Nonius CAD-4
diffractometer
Rint = 0.083
6278 measured reflections3 standard reflections every 3600 min
3053 independent reflections intensity decay: 1%
1318 reflections with I > 2σ(I)
Refinement top
R[F2 > 2σ(F2)] = 0.0450 restraints
wR(F2) = 0.131All H-atom parameters refined
S = 0.99Δρmax = 0.14 e Å3
3053 reflectionsΔρmin = 0.20 e Å3
153 parameters
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
O10.17490 (12)0.31145 (8)0.05794 (11)0.0485 (3)
C20.07109 (17)0.49919 (12)0.12096 (15)0.0405 (3)
H20.1192 (18)0.4974 (14)0.2046 (19)0.056 (4)*
C10.08722 (15)0.40293 (11)0.02389 (15)0.0359 (3)
C30.01473 (17)0.40407 (12)0.09822 (16)0.0396 (3)
H30.0248 (15)0.3394 (13)0.1655 (16)0.041 (4)*
C40.19920 (19)0.21175 (12)0.04228 (18)0.0433 (3)
H410.0989 (18)0.1743 (14)0.0394 (18)0.055 (5)*
H420.2464 (18)0.2379 (14)0.149 (2)0.057 (5)*
C50.30540 (19)0.12785 (13)0.01402 (18)0.0448 (3)
H510.2603 (17)0.1093 (13)0.120 (2)0.051 (4)*
H520.4042 (18)0.1690 (14)0.0138 (19)0.063 (5)*
C60.32979 (15)0.01729 (11)0.08147 (15)0.0380 (3)
C70.2447 (2)0.08291 (14)0.0338 (2)0.0517 (4)
H70.171 (2)0.0792 (14)0.064 (2)0.065 (5)*
C80.2610 (2)0.18284 (14)0.1243 (2)0.0607 (5)
H80.200 (2)0.2513 (18)0.094 (2)0.082 (6)*
C90.3636 (2)0.18409 (13)0.2643 (2)0.0584 (5)
H90.372 (2)0.2528 (16)0.326 (2)0.071 (5)*
C100.4519 (2)0.08611 (14)0.3135 (2)0.0542 (4)
H100.530 (2)0.0850 (15)0.414 (2)0.075 (6)*
C110.43395 (18)0.01403 (14)0.22327 (18)0.0475 (4)
H110.492 (2)0.0800 (15)0.254 (2)0.063 (5)*
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
O10.0647 (7)0.0396 (5)0.0473 (6)0.0162 (5)0.0257 (5)0.0092 (4)
C20.0474 (7)0.0398 (7)0.0384 (7)0.0022 (6)0.0179 (6)0.0034 (6)
C10.0388 (7)0.0323 (6)0.0378 (7)0.0022 (5)0.0114 (6)0.0003 (5)
C30.0488 (8)0.0334 (7)0.0388 (7)0.0031 (6)0.0143 (6)0.0067 (6)
C40.0510 (9)0.0367 (7)0.0457 (8)0.0095 (6)0.0182 (7)0.0080 (6)
C50.0509 (9)0.0415 (7)0.0441 (8)0.0091 (7)0.0157 (7)0.0032 (7)
C60.0422 (7)0.0342 (6)0.0406 (7)0.0084 (6)0.0153 (6)0.0013 (6)
C70.0540 (9)0.0463 (8)0.0526 (9)0.0017 (7)0.0075 (8)0.0085 (7)
C80.0727 (11)0.0359 (8)0.0756 (12)0.0054 (8)0.0213 (10)0.0071 (8)
C90.0780 (12)0.0372 (8)0.0664 (11)0.0145 (8)0.0299 (10)0.0097 (8)
C100.0610 (10)0.0533 (9)0.0472 (9)0.0150 (8)0.0100 (8)0.0070 (8)
C110.0481 (8)0.0429 (8)0.0503 (8)0.0010 (7)0.0089 (7)0.0003 (7)
Geometric parameters (Å, º) top
O1—C11.3756 (15)C5—H520.998 (16)
O1—C41.4275 (16)C6—C71.379 (2)
C2—C3i1.3801 (19)C6—C111.388 (2)
C2—C11.3809 (18)C7—C81.380 (2)
C2—H20.943 (17)C7—H70.968 (18)
C1—C31.3899 (19)C8—C91.369 (3)
C3—C2i1.3801 (19)C8—H80.95 (2)
C3—H30.940 (15)C9—C101.375 (2)
C4—C51.509 (2)C9—H90.947 (18)
C4—H410.986 (15)C10—C111.380 (2)
C4—H420.992 (18)C10—H101.01 (2)
C5—C61.5040 (19)C11—H110.917 (17)
C5—H510.966 (17)
C1—O1—C4118.15 (10)C4—C5—H52109.1 (9)
C3i—C2—C1121.20 (12)H51—C5—H52105.8 (13)
C3i—C2—H2120.2 (10)C7—C6—C11117.71 (14)
C1—C2—H2118.6 (10)C7—C6—C5121.03 (14)
O1—C1—C2116.15 (12)C11—C6—C5121.21 (13)
O1—C1—C3124.87 (11)C6—C7—C8121.40 (16)
C2—C1—C3118.98 (12)C6—C7—H7117.0 (10)
C2i—C3—C1119.82 (12)C8—C7—H7121.6 (10)
C2i—C3—H3120.1 (8)C9—C8—C7120.04 (16)
C1—C3—H3120.1 (8)C9—C8—H8118.1 (12)
O1—C4—C5107.93 (12)C7—C8—H8121.8 (12)
O1—C4—H41108.6 (9)C8—C9—C10119.79 (16)
C5—C4—H41110.8 (9)C8—C9—H9119.2 (11)
O1—C4—H42109.5 (10)C10—C9—H9121.1 (11)
C5—C4—H42110.3 (9)C9—C10—C11119.91 (17)
H41—C4—H42109.7 (14)C9—C10—H10121.7 (10)
C6—C5—C4110.95 (12)C11—C10—H10118.4 (10)
C6—C5—H51110.4 (9)C10—C11—C6121.15 (16)
C4—C5—H51108.2 (9)C10—C11—H11121.2 (11)
C6—C5—H52112.1 (9)C6—C11—H11117.7 (11)
C4—O1—C1—C2177.88 (13)C4—C5—C6—C1180.52 (18)
C4—O1—C1—C32.65 (19)C11—C6—C7—C80.7 (2)
C3i—C2—C1—O1179.78 (13)C5—C6—C7—C8176.75 (15)
C3i—C2—C1—C30.3 (2)C6—C7—C8—C90.2 (3)
O1—C1—C3—C2i179.73 (13)C7—C8—C9—C100.9 (3)
C2—C1—C3—C2i0.3 (2)C8—C9—C10—C111.6 (3)
C1—O1—C4—C5176.74 (13)C9—C10—C11—C61.2 (2)
O1—C4—C5—C6177.03 (12)C7—C6—C11—C100.1 (2)
C4—C5—C6—C796.80 (17)C5—C6—C11—C10177.47 (14)
Symmetry code: (i) x, y+1, z.

Experimental details

Crystal data
Chemical formulaC22H22O2
Mr318.40
Crystal system, space groupMonoclinic, P21/c
Temperature (K)293
a, b, c (Å)8.9286 (17), 11.3470 (11), 8.925 (2)
β (°) 103.311 (16)
V3)879.9 (3)
Z2
Radiation typeMo Kα
µ (mm1)0.08
Crystal size (mm)0.3 × 0.3 × 0.2
Data collection
DiffractometerEnraf-Nonius CAD-4
diffractometer
Absorption correction
No. of measured, independent and
observed [I > 2σ(I)] reflections
6278, 3053, 1318
Rint0.083
(sin θ/λ)max1)0.745
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.045, 0.131, 0.99
No. of reflections3053
No. of parameters153
H-atom treatmentAll H-atom parameters refined
Δρmax, Δρmin (e Å3)0.14, 0.20

Computer programs: CAD-4 EXPRESS (Enraf Nonius, 1994), CAD-4 EXPRESS, XCAD4 (Harms, 1996), SHELXS97 (Sheldrick, 1997), SHELXL97 (Sheldrick, 1997), ORTEP-3 (Farrugia, 1997), WinGX (Farrugia, 1999).

 

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