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Figure 3
(a) Example SFX diffraction image of ΔPEX11 cells displaying Bragg-sampled reflections with intensities above the background level. (b) Composite XRPD patterns assembled from individual diffraction images show that most crystallites diffract to approximately 30 Å resolution, with several crystals displaying diffraction out to the detector edge (6 Å) and corners (5.6 Å) as indicated by arrows in insets (c) and (d).

IUCrJ
Volume 3| Part 2| March 2016| Pages 88-95
ISSN: 2052-2525
doi:10.1107/S2052252515022927