The commissioning of a flexible low-cost multipurpose X-ray beamline at SRRC

Lee, C.-H.; Hwang, C.-S.; Tseng, P.-K.; Tseng, H.-C.; Yu, K.-L.; Su, W.-C.; Chen, J.-R.; Lin, T.-L.; Chang, S.-L.

doi:10.1107/S0909049598001381

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 3
An example of the energy-dispersive reflectivity measurement (rough data before correction). The sample is SiO₂ on an Si wafer. The oscillation intensity of measurement indicates that the thickness of SiO₂ is 200 Å. The incident X-ray angle is fixed at 1.2° and the detector fixed at 2.4°.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 5| Part 3| May 1998| Pages 512-514

https://doi.org/10.1107/S0909049598001381

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