editorial board of Journal of Synchrotron Radiation

editor-in-chief

S. S. Hasnain, Faculty of Health and Life Sciences, University of Liverpool, Life Sciences Building, Crown Street, Liverpool L69 7ZB, UK (e-mail: s.s.hasnain@liverpool.ac.uk)

editors

G. E. Ice, Materials Science and Technology Division, Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN 37831-6132, USA (e-mail: icege@ornl.gov)
Areas of expertise: X-ray optics; diffuse X-ray scattering; microbeam/microdiffraction.

I. Schlichting, Department of Biomolecular Mechanisms, Max Planck Institute for Medical Research, Jahnstrasse 29, 69120 Heidelberg, Germany (e-mail: jsr@mpimf-heidelberg.mpg.de)
Areas of expertise: biological crystallography; catalysis; macromolecular crystallography; structural biology; free-electron lasers.

J. F. van der Veen, Paul Scherrer Institut, 5232 Villigen PSI, Switzerland (e-mail: friso.vanderveen@psi.ch)
Areas of expertise: synchrotron radiation instrumentation; X-ray diffraction; materials science.

co-editors

P. Coppens, Department of Chemistry, 732 Natural Sciences and Mathematics Complex, State University of New York at Buffalo, Buffalo, NY 14260-3000, USA (e-mail: coppens@buffalo.edu)
Areas of expertise: time-resolved diffraction; ultrafast processes; EXAFS; beamline instrumentation; resonance scattering.

A. F. Craievich, Department of Applied Physics, Institute of Physics, University of São Paulo, PO Box 66318, São Paulo-SP, CEP 05315-970, Brazil (e-mail: craievich@if.usp.br)
Areas of expertise: small-angle scattering; powder X-ray diffraction; mechanisms of structure transformations; nanomaterials structure.

V. Favre-Nicolin, Institut Nanosciences and Cryogénie (INAC), CEA and Université Joseph Fourier (Grenoble), 17 rue des Martyrs, Grenoble 38054 Cedex 9, France (e-mail: vincent.favre-nicolin@cea.fr)
Areas of expertise: materials science; nanostructures; coherent scattering; anomalous scattering; diffuse scattering; powder diffraction; microbeam/microdiffraction; data collection and processing; instrumentation.

G. Grübel, HASYLAB at DESY, Notkestrasse 85, D-22607 Hamburg, Germany (e-mail: gerhard.gruebel@desy.de)
Areas of expertise: coherent X-ray scattering; X-ray photon correlation spectroscopy; free-electron laser science.

S. M. Heald, Advanced Photon Source, Bldg 435E, Argonne National Laboratory, 9700 Cass Avenue, Argonne, IL 60439, USA (e-mail: heald@aps.anl.gov)
Areas of expertise: XAFS; X-ray optics; X-ray microscopy.

A. Momose, Institute of Multisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan (e-mail: momose@tagen.tohoku.ac.jp)
Areas of expertise: X-ray optics; X-ray imaging; interferometry; dynamical X-ray diffraction.

P. A. Pianetta, Stanford Synchrotron Radiation Laboratory, SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, CA 94025, USA (e-mail: pianetta@stanford.edu)
Areas of expertise: imaging; instrumentation; semiconductors; surfaces.

D. A. Reis, Stanford Pulse Institute, SLAC National Accelerator Laboratory, 2575 Sand Hill Road, MS 59, Menlo Park, CA 94025, USA (e-mail: dreis@slac.stanford.edu)
Areas of expertise: time-resolved X-ray scattering; experimental condensed matter; optical physics.

R. W. Strange, Institute of Integrative Biology, Faculty of Health and Life Sciences, University of Liverpool, Liverpool L69 7ZB, UK (e-mail: r.strange@liverpool.ac.uk)
Areas of expertise: X-ray absorption spectroscopy; protein crystallography; structural biology.

S. Svensson, Department of Physics, Uppsala University, S-751 21 Uppsala, Sweden (e-mail: svante.svensson@fysik.uu.se)
Areas of expertise: X-ray photoelectron spectroscopy; instrumentation; X-ray optics; clusters; supersonic beams; HAXPES; time-resolved ARPES.

M. Yabashi, Beam Line Research and Development Group, XFEL Research and Development Division, RIKEN SPring-8 Center, 1-1-1 Kouto, Mikazuki-cho, Sayo-gun, Hyogo 679-5148, Japan (e-mail: yabashi@spring8.or.jp)
Areas of expertise: free-electron lasers; instrumentation; time-resolved studies; X-ray diffraction; X-ray optics.

book-review editor

M. Nespolo, Faculte des Sciences et Technologies, CRM2 UMR CNRS 7036, Universite de Lorraine, BP 70239, F54506 Vandoeuvre-les-Nancy Cedex, France (e-mail: massimo.nespolo@crm2.uhp-nancy.fr)

current-events editor

J. F. van der Veen, Paul Scherrer Institut, 5232 Villigen PSI, Switzerland (e-mail: friso.vanderveen@psi.ch)

Paul Zschack, Brookhaven National Laboratory, Upton, NY 11973, USA (e-mail: pzschack@bnl.gov)

managing editor

T. Weight, Editorial Office, IUCr Journals, 5 Abbey Square, Chester CH1 2HU, UK (e-mail: tw@iucr.org)


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