view article

Figure 1
Experimental and calculated reflectivities of the NiFe(10 nm)/Cu(10)/NiFe(10)/Ta(10)/Si multilayers measured for Cu Kα, Cu Kβ and Cu K-edge X-rays.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Follow J. Synchrotron Rad.
Sign up for e-alerts
Follow J. Synchrotron Rad. on Twitter
Follow us on facebook
Sign up for RSS feeds