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Figure 2
Expected processes for producing wedge-shaped samples using a linearly movable shutter and a quartz thickness monitor. (a) A wedge-shaped layer of metal A is produced. (b) The sample holder is rotated by 90° around a vertical axis. A layer of metal B wedge-shaped in the direction perpendicular to the wedge of the metal A layer is produced.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 5| Part 3| May 1998| Pages 1038-1040
https://doi.org/10.1107/S0909049597016129
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