Mapping of a particular element using an absorption edge with an X-ray fluorescence imaging microscope

Yamamoto, K.; Watanabe, N.; Takeuchi, A.; Takano, H.; Aota, T.; Fukuda, M.; Aoki, S.

doi:10.1107/S0909049599014260

Figure 3
The X-ray fluorescence images of five kinds of metallic wires and their spectra at an excitation energy of (a) 10 keV, (b) 8.970 keV (10 eV below the absorption edge of Cu), (c) 8.323 keV (10 eV below the absorption edge of Ni), (d) 7.699 keV (10 eV below the absorption edge of Co) and (e) 7.102 keV (10 eV below the absorption edge of Fe). The X-ray fluorescence images and their spectra, which were obtained by subtracting the data taken above and below the absorption edges of (f) the Cu K-edge (8.980 keV), (g) the Ni K-edge (8.333 keV), (h) the Co K-edge (7.709 keV) and (i) the Fe K-edge (7.112 keV). (j) A visible-light image after exposure.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 7| Part 1| January 2000| Pages 34-39

doi:10.1107/S0909049599014260

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