Silicon drift detectors as a tool for time-resolved fluorescence XAFS on low-concentrated samples in catalysis

Kappen, P.; Tröger, L.; Materlik, G.; Reckleben, C.; Hansen, K.; Grunwaldt, J.-D.; Clausen, B.S.

doi:10.1107/S0909049502005654

Figure 3
The energy resolution (FWHM) and the peak-to-background ratio (P/B) as a function of the total incoming count rate (TCR), measured for a single-pixel SDD. As a fluorescence test sample a Zn foil was irradiated with 10.5 keV photons. The data were acquired at two different temperatures, 293 K and 255 K.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 9| Part 4| June 2002| Pages 246-253

doi:10.1107/S0909049502005654

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