Deterministic retrieval of surface waviness by means of topography with coherent X-rays

Souvorov, A.; Yabashi, M.; Tamasaku, K.; Ishikawa, T.; Mori, Y.; Yamauchi, K.; Yamamura, K.; Saito, A.

doi:10.1107/S0909049502008804

Figure 4
(a) An intensity profile (solid line) of an image taken at a distance L = 0.68 m from the mirror compared with simulation (dashed line). The simulated plot is shifted downwards by 0.2 to make the comparison more clear. Intensity variation generates $[\sigma_I]$ ≃ 19%. (b) Differential intensity I_dif = I_exp - I_sim between experimental and simulated data. The intensity discrepancy is $[\sigma_{\Delta I}]$ = 3.5% over the total reflection area.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 9| Part 4| June 2002| Pages 223-228

doi:10.1107/S0909049502008804

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