High-resolution X-ray diffraction beamline at the LNLS for the study of charge, orbital and magnetic structures

Giles, C.; Yokaichiya, F.; Kycia, S.W.; Sampaio, L.C.; Ardiles-Saravia, D.C.; Franco, M.K.K.; Neuenschwander, R.T.

doi:10.1107/S0909049503020958

Figure 2
(a) Side and top views of the main components of the XRD2 beamline at LNLS: (i) bending-magnet source, (ii) X-ray mirror, (iii) double-crystal monochromator, (iv) end-station, (v) six-circle diffractometer. The total source-to-sample distance is 17.5 m and the sagittal-focusing monochromator is in a one-to-one configuration. (b) Schematic perspective view of the XRD2 beamline. The experimental hutch and other components are not shown for clarity.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 10| Part 6| October 2003| Pages 430-434

doi:10.1107/S0909049503020958

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