Diffraction anomalous fine-structure spectroscopy at beamline BM2 at the European Synchrotron Radiation Facility

Renevier, H.; Grenier, S.; Arnaud, S.; Bérar, J.F.; Caillot, B.; Hodeau, J.L.; Letoublon, A.; Proietti, M.G.; Ravel, B.

doi:10.1107/S0909049503021332

Figure 8
(a) DAFS spectra of the InAs (004) reflection, multiplied by $[A({\bf{Q}},E)/t]$ calculated with t = 0 [ $[A({\bf{Q}},E)]$ = 1] (dashed line) and t = 2.8 µm (one-tenth of an absorption length) (solid line). (b) Same as (a) but for the InAs (006) reflection. The total X-ray path length inside the sample, $[2t/\sin\theta_{\rm{B}}]$ , is about 19 µm for (004) and 11 µm for (006). (c) EDAFS oscillations of the InAs (004) reflection are strongly affected by absorption, whereas EDAFS oscillations of the InAs (006) reflection are not (d).

JOURNAL OF
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ISSN: 1600-5775

Volume 10| Part 6| October 2003| Pages 435-444

doi:10.1107/S0909049503021332

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