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Figure 3
Angle-dispersive diffraction patterns (integrated profiles) from In5Bi3 (a) at 10.3 GPa without heating and (b) at 15 GPa after annealing at 423 K for 4 h, corresponding to a decomposition in a two-phase mixture with bct c/a < 1 and bct c/a > 1. Rietveld refinements of the diffraction patterns are shown. `G' denotes peaks from the gasket material. λ = 0.4654 Å. For experimental details see Degtyareva & Degtyareva (2002BB6).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 12| Part 5| August 2005| Pages 584-589
doi:10.1107/S0909049505021321
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