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Figure 6
X-ray beam profile determination with a knife-edge scan. Left-hand figure: pinhole scan with fit and beam profile at the sample position; right-hand figure: distance increased by 1 mm. (From Paris et al., 2001BB29.)

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 12| Part 6| October 2005| Pages 758-764
doi:10.1107/S0909049505013440
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