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Figure 2
(a) Single-channel reflectances at −1.1 V (broken lines) and 0 V (solid lines). (b) In situ far-IR spectrum of a copper microelectrode at 0 V obtained with a grazing-angle objective (reference at −1.1 V).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 14| Part 5| August 2007| Pages 446-448
doi:10.1107/S0909049507029809
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