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Figure 7
Complementary plots showing the spatial distribution of (a) Ta and (b) Si determined by combined X-ray microdiffraction and microRaman spectroscopy. Ta distribution is shown by the intensity of the 002 β-phase reflection from X-ray diffraction data. Si distribution is shown from the 520 cm−1 Raman band intensity.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 16| Part 1| November 2009| Pages 22-29
doi:10.1107/S0909049508034663
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