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Figure 11
Comparison of the measured reflection-mode Cu K-edge EXAFS at a grazing angle of Θ = 0.185° of an oxidized Cu metal thin film with calculated data assuming a double-layered oxide structure with different film thicknesses for the CuO layer (d1) and the Cu2O layer (d2) on top of the copper layer. All the calculations were made within the framework of the Fresnel theory neglecting roughness effects for the different surfaces and interfaces. In the inset, the calculations are compared with the measured data at a grazing angle of Θ = 0.3° (k-range for the FTs: 1.75 Å−1 < k < 11.75 Å−1 for Θ = 0.185°, and 1.75 Å−1 < k < 12.75 Å−1 for Θ = 0.30°, respectively.)

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 16| Part 4| May 2009| Pages 443-454
doi:10.1107/S0909049509015684
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