view article
Figure 6
(a) CCD image of a specular reflection from a polystyrene (10 nm thick) coated Si substrate at 1.5° incident angle and with full-circle in-plane rotation. The sample normal points up. (b) Comparison of the vertical intensity profiles of the specular peak with (red) and without (black) in-plane motion.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 16| Part 6| October 2009| Pages 788-795
doi:10.1107/S0909049509037911
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS