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Figure 6
Result of a Rietveld-texture refinement for a diffraction image at ω = 0°. The presentation of the two-dimensional data is made in orthogonal coordinates. (a) Experimental data; diffraction lines show minima and maxima. (b) Rietveld fit without consideration of the texture; diffraction lines have constant intensities. (c) Rietveld-texture refinement with consideration of the texture; diffraction lines show minima and maxima.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 18| Part 4| July 2011| Pages 550-556
https://doi.org/10.1107/S0909049511011071
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