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Figure 4
Total emission spectra and element-specific XSW-FY profiles. (a) Total X-ray emission spectra collected at eight selected αi angles 0–7 in (b). The signal from Si is primarily from the substrate, although additional impurities, e.g. Cl and Br, are also present in the initial PAA solution. The elastic peak corresponds to the incident X-ray energy (14 keV) and Ag* is attributed to pulse processor pile-up owing to the high count rate for the Ag L-edge emission lines. (b, c, d) Measured XSW-FY intensities for Ag, Cr and Cl (open symbols). Fine-structure oscillations (1–7) in the XSW profiles are the result of interference between incoming and outgoing X-rays from the different interfaces in the multi-layered sample (see additional details in §2.2[link]).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 18| Part 6| October 2011| Pages 871-878
doi:10.1107/S090904951103843X
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