Automatic XAFS measurement system developed at BL14B2 in SPring-8

Oji, H.; Taniguchi, Y.; Hirayama, S.; Ofuchi, H.; Takagaki, M.; Honma, T.

doi:10.1107/S0909049511042518

Figure 3
(a) Sample alignment in the case of fluorescence mode. (b) The special sample holder designed for fluorescence-mode measurements.