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Figure 6
Illustration of the misorientation spread in the scattering volume at positions Im823 and Im2714 after the last deformation increment. (a) Experimentally collected Laue diffraction pattern Im823 with superimposed predicted reflection positions. (b) Four-dimensional orientation plot of Im823. Small rotation angles [\theta_{x}], [\theta_{y}] and [\theta_{x}] are given in degrees. Superimposed are the predicted rotation axes for the highest Schmid factor slip system [(\bar{1}\bar{1}1)[\bar{1}10]] (solid line) and for the [(\bar{1}\bar{1}1)[0\bar{1}\bar{1}]] slip system (dashed line). (c) Four-dimensional orientation plot of Im2714. Superimposed are the predicted rotation axes for the two highest Schmid factor slip systems: [(\bar{1}11)][[\bar{1}0\bar{1}]] (solid line) and [(\bar{1}1\bar{1})][[\bar{1}01]] (dashed line).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 19| Part 3| March 2012| Pages 307-318
doi:10.1107/S0909049512003044
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