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Figure 7
Dose dependence of the fixed oxide charge density Nox and the three dominant X-ray-induced interface states as a function of irradiation dose after annealing at 353 K for 10 min.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 19| Part 3| March 2012| Pages 340-346
doi:10.1107/S0909049512002348
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