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Figure 2
Two-dimensional GIXD pattern collected while rotating the sample by a full turn about the normal to the sample surface. The circles superimposed on the CCD image represent the position of the simulated diffraction spots from polycrystalline TEN with the (001) planes parallel to the sample surface (green circles), and from polycrystalline RUB with the (200) planes parallel to the sample surface (black circles). Also, the Miller indices of the reflections cited in the text are reported. The positions of the peaks in the experimental image are not corrected for detector misalignments.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 19| Part 5| July 2012| Pages 682-687
doi:10.1107/S0909049512027562
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