Figure 1
(Colour online) (a) Schematics of the diffraction imaging experiment. The sample is illuminated by a parallel X-ray beam under an incident angle set to the Bragg angle ([theta]Bragg) of the Pt(111) buffer layer. The elevation angle (eulerian geometry) is [psi]. The sample image is recorded by the high-resolution area detector (FReLoN). The part of the sample diffracting (Pt) is the part labelled as `electrode' [the inset shows the multi-layered structure of the sample (tunnel junction)]. (b) Optical microscopy image of the 120 µm-sized square junctions. (c) Radial scan (i.e. [theta]-2[theta] geometry) performed for a thick sample using a point detector (E = 15 keV; pink beam: [Delta]E/E = 10-2). (d) Images of the tunnel junction area taken for an incident angle of the sample set as the Bragg angle of the Pt peak; (1) mask alignment marks for lithography; (2) contact electrode; (3) junction area of the FReLoN chips; (4) square-shaped junctions (some of them with defects appearing as scratches).  [article HTML]