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Figure 2
Resolution of horizontal beam displacement measurements versus XBI magnification as measured at beamline B16 using the XBI set-up with a constant exposure time of 1 s. The filled circles represent the measured data points taken using the XBI device set-up reported in this paper whereas the solid line represents calculated resolution values as predicted by our model (Kachatkou & van Silfhout, 2013BB9). The open circles and the dashed line represent earlier measurements (Kachatkou & van Silfhout, 2013BB9) and the corresponding calculated resolution values, respectively. See the text for details.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 2| February 2014| Pages 333-339
doi:10.1107/S1600577513034759
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