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Figure 7
Flat-field image of a partially multilayer coated Si substrate recorded in total reflection conditions (projected q-vector vertical) with monochromatic illumination (15 keV). The region between the curved vertical dashed lines indicates the transition zone between the multilayer (ML) coating (left) and the uncoated Si substrate (right). Continuity of line features across the coating edge (the horizontal dashed lines show two such examples) illustrate the predominant influence of the substrate on wavefront degradation. The image is foreshortened in the vertical direction due to the grazing incidence (0.12°) illumination and intensity corrected to eliminate any intensity fluctuations due to the incoming illumination or detector response.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 5| August 2014| Pages 986-995
doi:10.1107/S1600577514015951
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