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Figure 5
Characterization of the microscope lateral resolution in reflection geometry. (a) Structural domains in a ferroelectric thin film collected at Q002 = 3.06 Å−1. The scale bar is 1 µm and the horizontal (red) line indicates where the line profile shown in (b) is extracted. The fit to the data is a combination of a Gaussian function and a linear background.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 21| Part 6| October 2014| Pages 1252-1261
doi:10.1107/S1600577514016555
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