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Figure 3
OT XRF technical overview. (a) Compact OT setup mounted on the beamline scanning stages (indication 1). The Vortex-EM detector is positioned under 45° with respect to the polarization plane, onto a set of translation stages (indication 2). (b) Detail of the sample area with an indication of the primary X-ray beam, confocal optic and the direction of the scattered photons.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 22| Part 4| July 2015| Pages 1096-1105
https://doi.org/10.1107/S1600577515009534
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