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Figure 5
Simulated (by MUSCAT) spectra of 57.8 keV polarized X-rays (P1 = −0.989) scattered by a 1.5 mm-thick Al sample and registered by two detectors (resolution 0.375 keV) at different scattering angles. Total spectra intensities are shown by solid lines, multiple (up to quadruple) scattering contributions are plotted by dotted lines.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 23| Part 1| January 2016| Pages 244-252
doi:10.1107/S1600577515018603
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