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Figure 1
Pattern characteristics as a function of the propagation distance between the diffraction mask and the detector. (a) In Fresnel diffraction each point carries information on the beam wavefront. (b) In Fraunhofer diffraction the signature of the beam characteristics is lost. Both patterns are observed under a LiF crystal and a CCD. The Fresnel pattern is smeared out if the pattern is detected with the CCD. However, such an effect is not observed in the Fraunhofer diffraction since the higher frequencies are far off the center of the pattern.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 24| Part 1| January 2017| Pages 196-204
https://doi.org/10.1107/S1600577516016568
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