An active piezoelectric plane X-ray focusing mirror with a linearly changing thickness

Tian, N.; Jiang, H.; Xie, J.; Yan, S.; Liang, D.; Jiang, Z.

doi:10.1107/S1600577523009566

Journal of Synchrotron Radiation Journal of
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Figure 3
Measured piezoelectric response function (curvature per volt) of the prototype for actuators 1–18 (a) and actuators 19 and 20 (b). Because of the linearly changing thickness of the mirror, PRFs in thin areas are greater than those in thick areas.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 31| Part 1| January 2024| Pages 10-16

https://doi.org/10.1107/S1600577523009566

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