issue contents
September 1995 issue
Cover illustration: Imaging-plate recording of crystal truncation rod (CTR) scattering from an Si(111) wafer taken by oscillating the sample over an angular range of ± 4.9 ° perpendicular to <111>. Courtesy of T. Shimura and J. Harada, Photon Factory, Japan.
obituaries
research papers
F. Bley,
F. Livet,
J. C. Leroux,
J. P. Simon,
D. Abernathy,
J. Als-Nielsen,
G. Gruebel,
G. Vignaud,
G. Dolino,
J. F. Legrand,
D. Camel,
N. Menguy and
M. Papoular
short communications
books received